Document Type

Article

Publication Date

1-1-1994

Abstract

Using data from the CLEO II detector at the Cornell Electron Storage Ring, we measure scrB(τ-→h-π0ντ) where h- refers to either π- or K-. We use three different methods to measure this branching fraction. The combined result is scrB(τ-→h-π0ντ)=0.2587±0. 0012±0.0042, in good agreement with standard model predictions. © 1994 The American Physical Society.

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